Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1996-12-31
1998-09-29
Font, Frank G.
Optics: measuring and testing
By polarized light examination
With light attenuation
356379, 356383, 356384, 356 72, 364560, 364564, 364567, 348136, G01B 1124, G01B 1102, H04N 718
Patent
active
058152741
ABSTRACT:
The invention is a method and apparatus for measuring the dimensions of a parcel for use in a parcel processing application. The invention includes the placing of a parcel on a weighing scale. A movably mounted emitter apparatus projects lines of a known distance apart onto the parcel so that the number of lines may be counted by a scanner to determine a first linear dimension of the placed parcel. After the first count is performed, the emitter apparatus is rotated in place 90.sub.-- so as to project a second set of lines on the first surface of the placed parcel. The second set of lines is then counted so as to determine a second linear dimension of the placed parcel. After the second count is performed, the emitter apparatus is moved so as to project a third set of lines on a second surface of the parcel, wherein the second surface is perpendicular to the first surface. The third set of lines is counted to determine the third linear dimension of the placed parcel. Counts one, two, and three are transmitted to a data processing device which applies the counts to a look-up table to determine a set of linear dimensions for the placed parcel. The linear dimensions and the weight are transmitted to the parcel processing application for further use within that system.
REFERENCES:
patent: 4528651 (1985-07-01), Brock et al.
patent: 4535782 (1985-08-01), Zoltan
patent: 4767212 (1988-08-01), Kitahashi et al.
patent: 4929843 (1990-05-01), Chmielewski, Jr. et al.
patent: 4931658 (1990-06-01), Tole
patent: 4993835 (1991-02-01), Inoue et al.
patent: 5004929 (1991-04-01), Kakimoki et al.
patent: 5088827 (1992-02-01), Kyriakis
patent: 5102223 (1992-04-01), Uesugi et al.
patent: 5229597 (1993-07-01), Fakutsu
patent: 5289261 (1994-02-01), Yogo
patent: 5305895 (1994-04-01), Hermann
patent: 5311999 (1994-05-01), Malow et al.
patent: 5325178 (1994-06-01), Louis et al.
patent: 5331118 (1994-07-01), Jensen
patent: 5367378 (1994-11-01), Harding et al.
patent: 5424836 (1995-06-01), Weir et al.
patent: 5469262 (1995-11-01), Keen et al.
patent: 5555090 (1996-09-01), Schmutz
Font Frank G.
Malandra Charles R.
Pitney Bowes Inc.
Scolnick Melvin J.
Vierra-Eisenberg Jason D.
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