Method for detecting bus shorts in semiconductor devices

Details Method for detecting bus shorts in semiconductor devices Method for detecting bus shorts in semiconductor devices

1996-12-23

1999-04-27

Beausoliel, Jr., Robert W.

Excavating

364489, G01R 3128

Patent

active

058987053

ABSTRACT:
A method is provided for generating test vectors to detect bridge faults in a semiconductor device. In one version of the invention, the method includes the steps of creating a net name data structure from a structural description of the semiconductor device which includes data representing the instance names for the nets to be tested, identifying a pair of nets in the net name data structure, and generating at least one test vector for the pair of nets such that, when the vectors impress on the nets, the state of the nets of the pair will change relative to each other such that logic, coupled to the pair, produces a signal which indicates whether a bridge fault exists between the nets of the pair.

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