Method for forming semiconductor field region dielectrics having

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437228, 437235, 1566281, H01L 2131

Patent

active

058307737

ABSTRACT:
An isolation technique is provided for improving the overall planarity of trench isolation regions relative to adjacent silicon mesas. The isolation process results in a spaced plurality of field dielectric having an upper surface substantially coplanar with each other and with adjacent silicon mesa upper surfaces. The isolation process is thereby a planarization process used with the shallow trench technique, wherein etch-enhancing ions are forwarded into the fill dielectric at upper elevational regions of that dielectric. When subjected to a subsequent etchant, the dopants cause the higher elevational regions to be removed at a faster rate than the lower elevational regions. Thus, selective placement of dopants and etch removal pre-conditions the fill dielectric upper surface to a more planar surface globally across the entire wafer. After etch removal predominantly at the higher elevational regions, the remaining fill dielectric upper surface is removed to a level commensurate with the upper surface of silicon mesas thereby producing separate field dielectrics interposed between silicon mesas. The field dielectrics, regardless of their lateral area, each have a substantially planar upper surface at or slightly below the adjoining silicon mesas. By producing planar field dielectric upper surfaces, various problems of non-planarity are removed from the thin films which are thereafter formed on the field dielectrics or between the field dielectrics and silicon mesas.

REFERENCES:
patent: 4662064 (1987-05-01), Hsu et al.
patent: 5413953 (1995-05-01), Chien et al.
patent: 5441094 (1995-08-01), Pasch
International Search Report for PCT/US 97/02502, dated Jun. 4, 1997.
Wolf, Stanley, Silicon Processing for the VLSI Era, vol. 1, (1986) pp. 183-185, 321-323.
Wolf, Stanley, Silicon Processing for the VLSI Era, vol. 2 (1990) pp. 200-201. 222-226, 238-239.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for forming semiconductor field region dielectrics having does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for forming semiconductor field region dielectrics having, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for forming semiconductor field region dielectrics having will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-688610

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.