Method of making porous-si capacitor dram cell

Semiconductor device manufacturing: process – Making passive device – Stacked capacitor

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438255, H01L 2120

Patent

active

058145494

ABSTRACT:
A method of manufacturing porous-Si capacitors for use in semiconductor memories is disclosed herein. The present invention includes a SOG layer as an etching mask to etch a polysilicon layer to form a porous-Si structure. The etching process is performed to etch a portion of the first conductive layer and to etch away the remaining HSG-Si. Next, the residure SOG layer is removed to define a porous-Si bottom storage. Utilizing the porous-Si structure, the present invention can be used to increase the surface area of the capacitor.

REFERENCES:
patent: 5254503 (1993-10-01), Kenney
patent: 5256587 (1993-10-01), Jun et al.
patent: 5342800 (1994-08-01), Jun

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