Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-02-09
1997-02-04
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324758, G01R 3102
Patent
active
056002599
ABSTRACT:
A multi-pin probe including a printed circuit board with multiple electrically conductive vias, multiple probes, each probe inserted into one of the electrically conductive vias, and a housing having multiple cavities inserted over the multiple probes, each cavity having a first and a second aperture around one of the probes, the first aperture being smaller than the second aperture. In addition, a method of manufacturing a multi-pin probe including the steps of manufacturing a printed circuit board with multiple electrically conductive vias, inserting multiple probes into the electrically conductive vias, and inserting a housing having multiple cavities over the multiple probes, each cavity having a first and a second aperture around one of the probes, the first aperture being smaller than the second aperture.
REFERENCES:
patent: 4230985 (1980-10-01), Matrone et al.
patent: 4465972 (1984-08-01), Sokolich
patent: 4508405 (1985-04-01), Damon et al.
patent: 4535536 (1985-08-01), Wyss
patent: 4609243 (1986-09-01), Wyss
patent: 4707655 (1987-11-01), Kruger
patent: 4799007 (1989-01-01), Cook et al.
patent: 4803424 (1989-02-01), Ierardi et al.
patent: 4857009 (1989-08-01), Christensen
patent: 4870353 (1989-09-01), Cook
patent: 4870354 (1989-09-01), Davaut
patent: 4899106 (1990-02-01), Ogura
patent: 4906920 (1990-03-01), Huff et al.
patent: 4939454 (1990-07-01), Miner
patent: 4980637 (1990-12-01), Huff et al.
patent: 5077598 (1991-12-01), Bartelink
patent: 5105148 (1992-04-01), Lee
patent: 5136238 (1992-08-01), Kade
Bartyzel Bernd
Duncan Steven A.
Fields Daniel A.
Vanderlee Keith A.
Dillon Andrew J.
Emile Volel
International Business Machines - Corporation
Karlsen Ernest F.
Kobert Russell M.
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