Method and apparatus for testing electronic circuitry in a manuf

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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324501, G01R 31308

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active

057148880

ABSTRACT:
A manufacturing environment(100) includes test equipment (130) that tests circuitry (110) for functional operation. An electromagnetic probe (137) is operated adjacent to a substrate having electronic circuitry to be tested (310). The electromagnetic probe is activated to directly stimulate a localized portion of the electronic circuitry with a wireless signal (320). Functional operation of the circuitry is determined by measuring the response of the electronic circuitry (330, 340). In one embodiment, an array of electromagnetic probes is operated to receive near-field electromagnetic emissions emanating from the circuitry. These emissions are measured and an electromagnetic profile generated for a portion of the circuitry (330). The electromagnetic profile is analyzed to determine functional operation of the circuitry (340).

REFERENCES:
patent: 4876656 (1989-10-01), Leicht et al.
patent: 5218294 (1993-06-01), Soiferman
patent: 5424633 (1995-06-01), Soiferman
patent: 5517110 (1996-05-01), Soiferman

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