Mass spectrometer with superimposed electric and magnetic fields

Details Mass spectrometer with superimposed electric and magnetic fields Mass spectrometer with superimposed electric and magnetic fields

1975-02-25

1976-10-05

Smith, Alfred E.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250294, B01D 5944

Patent

active

039846822

ABSTRACT:
A mass spectrometer employing superimposed electric and magnetic fields arranged substantially at right angles. The central orbit of the ion beam is located on an equipotential surface in the electric field at right angles to the magnetic field. The ions constituting the ion beam are separated in accordance with their mass to charge ratios by superimposed fields. The field strengths are adjusted to satisfy the two dimensional double focusing condition.

REFERENCES:
patent: 3061720 (1962-10-01), Ewald
patent: 3816748 (1974-06-01), Harrison
patent: 3886357 (1975-05-01), Naito

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