Electrical contact test apparatus to test contact resistance of

Details Electrical contact test apparatus to test contact resistance of Electrical contact test apparatus to test contact resistance of

1980-10-01

1982-06-22

Krawczewicz, Stanley T.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158F, G01R 3122

Patent

active

043364969

ABSTRACT:
To measure contact resistance between a probe and a terminal sample, and to insure gentle engagement of the probe on the sample, a scale beam is used which has an adjustable engagement weight, and which is lowered under control of a cam disk with an interposed magnetic system in which two magnets of equal polarity are placed adjacent each other so that, due to the repelling force of the two magnets, jolt-free, vibration-free engagement is possible, providing in effect a magnetic buffer. Preferably, the probe is a test wheel which, upon lowering from a raised position, can be disengaged from the drive motor which, when the test probe is off the sample terminal, rotates the wheel so that a fresh wheel surface is available for subsequent measurement. Engagement force can be controlled by suitable positioning of a counter weight, for example by a servo motor.

REFERENCES:
patent: 3041868 (1962-07-01), Schaschl et al.
patent: 4267506 (1981-05-01), Shiell
patent: 4267507 (1981-05-01), Guerpont
Croisier et al., Tester For Semiconductor Devices, IBM Technical Disclosure Bulletin, Nov. 1964, pp. 444, 445.
Schiff et al., Testing of Contact Conditions of Galvanically Deposited Layers, Metalloberflache, Oct. 1978, pp. 423-429.

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