Method and apparatus for measuring jitter in a periodic signal

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Details

364486, 364481, 324 83D, 324 83R, 375118, G01R 2902

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active

048962716

ABSTRACT:
Jitter in a clock signal is measured by using the clock signal to clock a digitizer repetitively digitizing a highly stable sine wave signal so as to produce a first data sequence representing the magnitiude of the sine wave signal as a function of time. This first data sequence is normalized to produce a second data sequence having data elements that vary between maximum and minimun magnitudes of +1 and -1. The arcsine of each element of the second data sequence is then determined to provide a monotonically increasing third data sequence, wherein each element of the third data sequence indicates a phase angle associated with a corresponding element of the second data sequence. A fourth data sequence is then generated, each element of the fourth data sequence representing a difference between a phase angle represented by a corresponding element of the third data sequence and a phase angle that the corresponding element of the third data sequence would represent if the clock signal had a constant frequency. The fourth data sequence provides a measure of clock signal jitter as a function of time.

REFERENCES:
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patent: 4327258 (1982-04-01), Zumbahlen, Jr. et al.
patent: 4412299 (1983-10-01), Huffman
patent: 4514855 (1985-04-01), Lang et al.
patent: 4563637 (1986-01-01), De Bortoli et al.
patent: 4654861 (1987-03-01), Godard
patent: 4689804 (1987-08-01), Srinivasagopalan et al.
patent: 4777640 (1988-10-01), Turner et al.

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