Patent
1988-09-08
1990-01-23
Mintel, William
357 38, 357 28, 357 3214, H01L 2978
Patent
active
048961965
ABSTRACT:
A vertical DMOS or IGBT cell structure with an integral operating condition sensor provided by a sensor region forming a PN junction 65 with an adjacent region of the cell and having a sensor region contact 75 for conducting a test current without interfering with normal operation of the cell.
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Blanchard Richard A.
Cooper David
Mintel William
Siliconix incorporated
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