Patent
1995-09-27
1998-04-14
Nguyen, Hoa T.
G06F 1100
Patent
active
057403520
ABSTRACT:
Methods and apparatus for a non-invasive test tool for testing and monitoring the interactions between an embedded microprocessor and its programs, various input analog and discrete electrical signals, and an LCD output display screen. The test tool uses a physical probe, preferably coupled in a non-invasive manner to the pins of the LCD display screen, and specialized hardware to capture the LCD output of the software-under-test as an event interaction between the microprocessor and various inputs. The captured LCD output is converted to a standard pixel format and stored for testing. The standard pixel format comprises a color and/or intensity value for each pixel position of interest, stored into a data structure. One embodiment uses a conversion which includes adding the time-modulated pixel data of a plurality of frames to generate a single composite frame having a color and/or intensity value for each pixel position of interest.
REFERENCES:
patent: 4044244 (1977-08-01), Foreman et al.
patent: 4055801 (1977-10-01), Pike et al.
patent: 4317199 (1982-02-01), Winslow
patent: 4364080 (1982-12-01), Vidovic
patent: 4471348 (1984-09-01), London et al.
patent: 4513318 (1985-04-01), Wilensky et al.
patent: 4646299 (1987-02-01), Schinabeck et al.
patent: 4649515 (1987-03-01), Thompson et al.
patent: 4713758 (1987-12-01), De Kelaita et al.
patent: 4723158 (1988-02-01), White
patent: 4780755 (1988-10-01), Knierim
patent: 4937740 (1990-06-01), Agarwal et al.
patent: 4947106 (1990-08-01), Chism
patent: 5041976 (1991-08-01), Marko et al.
patent: 5043984 (1991-08-01), Tomisawa et al.
patent: 5055928 (1991-10-01), Klingelhofer
patent: 5289116 (1994-02-01), Kurita et al.
patent: 5335342 (1994-08-01), Pope et al.
patent: 5404318 (1995-04-01), Hoffert et al.
patent: 5459410 (1995-10-01), Henley
patent: 5508721 (1996-04-01), Hattori
patent: 5526043 (1996-06-01), Wen
Troutman et al., "Characterization of TFT/LCD Arrays", IEEE Display Research Conference, Conference Record of the 1991 Intl, Oct. 1991, pp. 231-234.
Louden Michael S.
Murphy-Newman Richard L.
Philipp Richard L.
B-Tree Verification Systems, Inc.
Elmore Stephen C.
Nguyen Hoa T.
LandOfFree
Liquid-crystal display test system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Liquid-crystal display test system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Liquid-crystal display test system and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-645493