Method and apparatus for improving data failure rate testing for

Details Method and apparatus for improving data failure rate testing for Method and apparatus for improving data failure rate testing for

1992-10-30

1995-05-16

Canney, Vincent P.

Excavating

371 213, 371 214, G11C 2900

Patent

active

054167825

ABSTRACT:
A circuit for testing the data failure rate of a flash memory array comprising apparatus for writing a test pattern to a memory array; and apparatus positioned in a data path prior to the interface between the memory array and circuitry external to the memory array for detecting differences in data read from the memory array and the test pattern written to the memory array, the last mentioned apparatus including apparatus for reading data from the memory array, apparatus for comparing the value of data read from the memory array with the value of data written to the array in the test pattern, and apparatus for storing a indication that a comparison has produced a result indicating a failure to compare.

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