Method and apparatus for the analysis and correction of the imag

Details Method and apparatus for the analysis and correction of the imag Method and apparatus for the analysis and correction of the imag

1995-01-23

1998-05-05

Couso, Yon J.

Image analysis

Image enhancement or restoration

Variable threshold, gain, or slice level

382169, G06K 938

Patent

active

057488029

ABSTRACT:
A method and apparatus for the analysis and correction of the image gradation of an image original to be reproduced by evaluating image values acquired by point-by-point and line-by-line, optoelectronic scanning with an input device in apparatus and systems for image processing. The image original is geometrically subdivided into a plurality of sub-images. The frequency distribution of the image values or, respectively, of the luminance components of the color values in a corresponding sub-image is separately identified as a sub-image histogram. The sub-image histograms of the individual sub-images are evaluated and the sub-images relevant for the image gradation are identified by means of the evaluation. An aggregate histogram that corresponds to the frequency distribution of the image values or, respectively, of the luminance component of the color values in the relevant sub-images is calculated from the sub-image histograms of the relevant sub-images. Correction values for the correction of the image gradation characteristic of the image original are subsequently calculated from the aggregate histogram according to the method of histogram modification.

REFERENCES:
patent: 4411015 (1983-10-01), Scherl et al.
patent: 4654722 (1987-03-01), Alkofer
patent: 4972257 (1990-11-01), Birnbaum et al.
patent: 5121224 (1992-06-01), Ng et al.
patent: 5140649 (1992-08-01), Kageyama
patent: 5222154 (1993-06-01), Graham et al.
patent: 5239378 (1993-08-01), Tsuji et al.
patent: 5315389 (1994-05-01), Izawa et al.

Affiliated with

Also associated with

Rating

Method and apparatus for the analysis and correction of the imag does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for the analysis and correction of the imag, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for the analysis and correction of the imag will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-64308