Method for built-in self-testing of ring-address FIFOs

Details Method for built-in self-testing of ring-address FIFOs Method for built-in self-testing of ring-address FIFOs

1994-12-28

1996-04-30

Nguyen, Hoa T.

39518506, 39518507, 39518318, G06F 1100

Patent

active

055133185

ABSTRACT:
A dual-port, RAM-type ring-address FIFO (100) is tested by causing the FIFO to execute a composite test method comprised of set of interwoven steps (( 1 )-(31 ) or (1')-(25')). Upon execution, the steps of the composite method cause the FIFO (100) to manifest all possible memory, address and functional faults. The test method manifests faults by causing the FIFO (100) to alter the state of the various flags it normally sets and by altering the logic state of the data normally produced by the FIFO.

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Y. Zorian, A. J. van de Goor, and I. Schanstra, Proceedings, IEEE International Test Conference, Washington DC, Oct. 1994, pp. 378-387.
Y. Zorian, A. J. van de Goor, and I. Schanstra, Presentation, IEEE International Test Conference, Washington DC, Oct. 1994

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