Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-10-24
1997-07-29
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324755, 3241581, G01R 3106
Patent
active
056525249
ABSTRACT:
An improved load board design having a generic test circuit integrated into the load board capable of functioning with varying devices under test and requires little to no wiring. The test circuit is located in a fixed and optimal position of the load board with relation to the DUT. In a preferred embodiment, the test circuit is a quiescent test circuit for interfacing an integrated circuit tester to the DUT. The quiescent test circuit is capable of supplying high powered voltage to a DUT while the DUT's desired internal state is reached. At this point, the integrated circuit tester, sends an active select signal to the quiescent test circuit instantaneously deselecting the high-powered voltage supply to the DUT and selecting the integrated circuit tester's parametric measurement unit for powering the DUT. The integrated circuit tester, through a parametric measurement unit is capable of measuring the quiescent current of the DUT, while powering the DUT.
REFERENCES:
patent: 3676777 (1972-07-01), Charters
patent: 3895297 (1975-07-01), Jarl
patent: 4631724 (1986-12-01), Shimizu
patent: 4712058 (1987-12-01), Branson et al.
patent: 4746855 (1988-05-01), Wrinn
patent: 4849691 (1989-07-01), Siefers
patent: 5025344 (1991-06-01), Maly et al.
patent: 5032789 (1991-07-01), Firooz et al.
patent: 5057774 (1991-10-01), Verhelst et al.
patent: 5101149 (1992-03-01), Adams et al.
patent: 5101151 (1992-03-01), Beaufils et al.
patent: 5101153 (1992-03-01), Morong, III
patent: 5146161 (1992-09-01), Kiser
patent: 5157326 (1992-10-01), Burnsides
patent: 5285152 (1994-02-01), Hunter
patent: 5294883 (1994-03-01), Akiki et al.
patent: 5371457 (1994-12-01), Lipp
patent: 5392293 (1995-02-01), Hsue
patent: 5404099 (1995-04-01), Sahara
patent: 5406217 (1995-04-01), Habu
patent: 5412315 (1995-05-01), Tsuda
patent: 5414352 (1995-05-01), Tanase
patent: 5559445 (1996-09-01), Eaddy et al.
Fell III Joseph H.
Jennion Mark W.
Scorsone Joseph J.
Selby III Paul H.
Nguyen Vinh P.
O'Rourke John F.
Sowell John B.
Starr Mark T.
Unisys Corporation
LandOfFree
Built-in load board design for performing high resolution quiesc does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Built-in load board design for performing high resolution quiesc, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Built-in load board design for performing high resolution quiesc will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-636136