Measuring and testing – Gas analysis – Moisture content or vapor pressure
Patent
1995-06-07
1997-07-29
Williams, Hezron E.
Measuring and testing
Gas analysis
Moisture content or vapor pressure
7333505, 73 2902, 73 2905, 324678, 324694, G05D 2200, G01W 100
Patent
active
056523823
ABSTRACT:
An oscillator circuit includes a gate G.sub.11 of C-MOS type (Q.sub.1, Q.sub.2, and the like) having the function of increasing an operating current i with increasing operating frequency. A humidity sensor HS changing electric impedance thereof in accordance with humidity is arranged in part of the oscillator circuit. The oscillator circuit converts a change in humidity into a change in frequency, causes the gate G.sub.11 to convert the change in frequency into a change in operating current i, and outputs the converted change in operating current i. Further, in order to increase the change in operating current i due to the change in frequency, a series circuit consisting of a capacitor C.sub.13 and a resistor R.sub.17 is connected to the gate G.sub.11 as a capacitive load.
REFERENCES:
patent: 4546916 (1985-10-01), Tsuaki
patent: 4662220 (1987-05-01), Laue
patent: 4816748 (1989-03-01), Tazawa et al.
patent: 4915816 (1990-04-01), Shakkottai et al.
patent: 5065625 (1991-11-01), Nakagawa et al.
patent: 5317274 (1994-05-01), Nakagawa et al.
Aizawa Kenji
Nakagawa Shiro
Takahashi Eiji
Tsuchida Atsuko
TDK Corporation
Wiggins J. David
Williams Hezron E.
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