Scanning method with scanning probe microscope

Details Scanning method with scanning probe microscope Scanning method with scanning probe microscope

1995-10-17

1997-07-29

Williams, Hezron E.

Measuring and testing

Surface and cutting edge testing

Roughness

G01B 528

Patent

active

056523777

ABSTRACT:
A scanning method with a scanning probe microscope, wherein the scan time and the timing of data measurement are optimized on the basis of transient characteristics of vibration of the cantilever, and the ruggedness of the sample surface and the influence of the magnetic force inclination are measured in one scanning process, at every point of measurement, using a magnetic probe, so that the ruggedness of the sample surface and the magnetic force distribution are separately detected.

REFERENCES:
patent: 5168159 (1992-12-01), Yagi
patent: 5267471 (1993-12-01), Abraham et al.
patent: 5280341 (1994-01-01), Nonnenmacher et al.
patent: 5391871 (1995-02-01), Matsuda et al.
patent: 5406832 (1995-04-01), Gamble et al.
patent: 5436448 (1995-07-01), Hosaka et al.
patent: 5440121 (1995-08-01), Yasutake et al.
S. Hues et al., "Scanning Probe Microscopy of Thin Films", MRS Bulletin, Jan. 1993, pp. 41-49.
P. Hobbs et al., "Atomic Force Microscope: Implementations", Scanning Microscopy Technologies and Applications, SPIE vol. 897, 1988, pp. 26-30.
M. Radmacher et al., "From Molecules to Cells: Imaging Soft Samples with the Atomic Force Microscope", Science, vol. 257, 25 Sep. 1992, pp. 1900-1905.
Y. Martin et al; "Atomic Force Microscope--Force Mappling and Profiling On A Sub 100-A Scale"; May 15, 1987; pp. 4723-4729; Journal of Applied Physics; vol. 61; No. 10.

Affiliated with

Also associated with

Rating

Scanning method with scanning probe microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scanning method with scanning probe microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning method with scanning probe microscope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-634921