Probe with reduced input capacitance

Details Probe with reduced input capacitance Probe with reduced input capacitance

1992-09-03

1996-04-30

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 725, 324149, G01R 106

Patent

active

055128386

ABSTRACT:
A test probe includes a probe tip electrically connected to a probe amplifier. The probe tip includes an input conductor, a shield conductor, and a middle conductor between the input conductor and the shield. The capacitance between the middle conductor and the input conductor are employed in a frequency compensation circuit. In one embodiment the three conductors form a triaxial probe tip. The middle conductor is a thin film formed along an equipotential surface defined between the input conductor and the shield with the middle conductor not present.

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Jim Williams, High Speed Amplifier Techniques, Linear Technology AN47-1, Aug. 1991, United States.
Walters, et al., Probing techiques become crucial above 500 Mhz, Electronics Design News, Oct. 15, 1987, pp. 165-174, United States.

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