Electrical testing device

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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Details

324158P, 324 73PC, 324 725, G01R 106, G01R 3102

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active

048780189

ABSTRACT:
An electrical test system is provided including a plurality of parallel probes made of a spring quality, wire-type conductive material having a diameter ranging between 0.001 and 0.050 inch. The probes are carried in a housing which moves them towards and away from an electronic component being tested. Each probe extends into a housing between the housing and the electronic component being tested, and each probe has a bend in its end which engages the housing wall and permits the housing to move the probe in and out of a conductive tubular member. Preferably, the tubular members are moved sideways as the housing is moved toward and away from the component being tested. The ends of the probes in the tubular member engage the side wall of these members to provide electrical contact.

REFERENCES:
patent: 3493853 (1970-02-01), Baron et al.
patent: 3731191 (1973-05-01), Bullard et al.
patent: 4063172 (1977-12-01), Faure et al.
patent: 4086465 (1978-04-01), Sylvester
patent: 4518910 (1985-05-01), Hottenrott et al.
patent: 4544888 (1985-10-01), Kvaternik
patent: 4686464 (1987-08-01), Elsasser et al.
Bruder et al; "Dual Buckling Beam Connectors for Test Probes;" IBM Technical Disclosure Bulletin; vol. 17, No. 2; Jul. 1974; pp. 638-639.
Lipschutz et al; "Buckling Wire Probe Asembly"; IBM Technical Disclosure Bulletin; vol. 15, No. 10, Mar. 1973; pp. 3032-3033.

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