Patent
1984-03-02
1985-12-10
Edlow, Martin H.
357 16, 357 17, 357 30, 357 88, H01L 2712
Patent
active
045583366
ABSTRACT:
Misfit dislocation density at an InAs-GaAs interface is reduced in both InAs-GaSb and In.sub.1-x Ga.sub.x As-GaSb.sub.1-y As.sub.y superlattices grown on GaAs substrates by means of an MBE (molecular beam epitaxy) growth technique consisting of a step graded sequence of composition layers between substrate and superlattice whose composition changes in discrete concentration steps from the composition of the substrate to the composition of the superlattice.
REFERENCES:
patent: 3626257 (1971-12-01), Esaki
patent: 4088515 (1975-04-01), Blakeslee
patent: 4319259 (1982-03-01), Oshima
patent: 4370510 (1983-01-01), Stirn
Chang et al., Appl. Phys. Lett., vol. 31, No. 11, Dec. 1, 1977, pp. 759 et. eq.
Chang Chin-An
Chang Leroy L.
Esaki Leo
Edlow Martin H.
Lane Anthony T.
Maikis Robert A.
Murray Jeremiah G.
The United States of America as represented by the Secretary of
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