Metal-to-moat contacts in N-channel silicon gate integrated circ

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357 23, 357 59, 357 68, H01L 2348, H01L 2946, H01L 2954

Patent

active

042348897

ABSTRACT:
A double-level polycrystalline silicon structure for an N-channel MOS integrated circuit is disclosed including a metal interconnect level. Contact between the metal interconnect level and N+ diffused moat areas is made through discrete second-level polysilicon areas which reduce the step from metal level to moat level, thus increasing yields. Also, connections from the metal level to the first level polysilicon are made using a discrete area of second level polysilicon to minimize the step.

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