Method of testing the interconnection between logic devices

Details Method of testing the interconnection between logic devices Method of testing the interconnection between logic devices

1994-11-15

1996-10-08

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

G01R 3102

Patent

active

055635075

ABSTRACT:
A test circuit for testing interconnections to a non-scannable digital device of a multiple device circuit disposed on an interconnecting substrate. The test circuit includes a current detecting circuit switchably connected between first and second power supply bias nodes of the digital device, and circuitry for applying a pattern of logical test signals to selected ones of the input and output nodes of the digital device, whereby the current detecting circuitry detects the conduction of current in the reverse bias paths of input and output buffers of the device. The circuitry for applying test signals can comprise a scannable digital device included with the non-scannable device on the interconnecting substrate, as well as automatic test equipment connected to inputs and outputs of the interconnecting substrate.

REFERENCES:
patent: 5025344 (1991-06-01), Maly et al.
patent: 5043655 (1991-08-01), Anholm, Jr. et al.
patent: 5343431 (1994-08-01), Ohtsuka et al.

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