Detector z-axis gain non-uniformity correction in a computed tom

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

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378 19, 378901, A61B 603

Patent

active

057346917

ABSTRACT:
The present invention, in one form, corrects any error due to varying detector cell gains in the z-direction represented in data obtained by a scan in a CT system. The CT system includes an x-ray source which emits an x-ray beam from a focal spot, through a collimator aperture, and towards a detector having a plurality of detector cells. The geometry of the x-ray beam, the width of the collimator aperture and the focal spot size are used to determine the z-profile of the x-ray beam across the detector cells. Such z-profile is used to identify effective detector cell gains. The identified effective detector cell gains, rather than actual detector cell gains, are used to correct errors due to varying detector cell gains. Particularly, the identified effective detector cell gains are employed in a known correction algorithm to correct errors. A local average in an x-direction of actual detector cell gain z-profiles is used to determine a non-rectangular norm detector gain z-profile. In one form of the present invention, and after correcting the image data for beam-hardening, the data is passed through a highpass filter to remove any data representing relatively slow, or low frequency, changes. Next, the filtered data is clipped and view averaged to remove high frequency data contents due to the objects being imaged. A slope estimate is then created. Using the slope estimate, an error estimate is generated. The error estimate is then subtracted from the beam-hardened corrected data, for example. As a result, errors due to z-axis gain variation of the detector cells are removed from the projection data array.

REFERENCES:
patent: 5473656 (1995-12-01), Hsieh et al.
patent: 5579359 (1996-11-01), Toth

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