System for selecting high-reliability integrated circuits

Details System for selecting high-reliability integrated circuits System for selecting high-reliability integrated circuits

1982-05-13

1985-01-22

Smith, Jerry

Excavating

371 27, 324 73R, G01R 3128

Patent

active

044956223

ABSTRACT:
The selecting system makes use of a bank of amplifiers for successively and sequentially exciting P different types of integrated circuits assembled together in groups. The amplifying channels are periodically enabled one after the other by means of a demultiplexing circuit controlled from a processing and programming unit designated as PPU. The direct-current supplies comprise a programmable supply which is also addressed by the PPU and the output of which is applied to a switching matrix, the matrix being also addressed by the PPU and connected via P outputs respectively to the P groups of integrated circuits. Transmission of the excitation signals to the group of integrated circuits relating to said signals is performed by means of a second switching matrix addressed by the PPU. A mass memory unit such as a microprocessor is associated with the PPU and can have an electric functional test program for programming the excitation signals desired for selection.

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