Method of manufacturing semiconductor device

Metal working – Method of mechanical manufacture – Assembling or joining

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29578, 29577C, 148 15, 357 4, 357 2311, 357 54, 156643, 156657, H01L 2122, H01L 21306

Patent

active

045245088

ABSTRACT:
A method of manufacturing a semiconductor device comprises forming a mask of a predetermined pattern on a first conductive layer (3) deposited over a semiconductor substrate (1) and etching physically first conductive layer so that the side surfaces thereof are substantially perpendicular to a surface of the semiconductor substrate. After removing the mask on the pattern, a first insulating layer (7) is deposited over the whole upper surface of the semiconductor substrate including the first conductive layer. A physical etching is made over the first insulating layer until the surface of the semiconductor substrate is exposed, so that a portion (7a) of the first insulating layer (7) is left in a stepped portion of the side surfaces of the first conductive layer. Then, a second insulating layer (5) is formed over a whole upper surface of the semiconductor substrate including the portion (7a) of the insulating layer and the first conductive layer. Subsequently, a second conductive layer (6) is formed over the whole upper surface thereof.

REFERENCES:
patent: 4234362 (1980-11-01), Riseman
patent: 4368085 (1983-01-01), Peel
patent: 4385432 (1983-05-01), Kuo et al.
patent: 4413402 (1983-11-01), Erb

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