Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1994-12-02
2000-07-11
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356446, G01B 1130
Patent
active
060881046
ABSTRACT:
A hand-held instrument provides a simple and elegant approach to determining the presence or absence of a surface condition such as roughening. A light source such as a laser diode illuminates a localized area of the surface to be characterized, and a light-sensitive detector is supported to receive light reflected by the surface and generate an electrical signal representative of the light received. An optical blocking element is placed at a first point along the axis of the reflected light, and a focussing lens is placed at a second point along the axis. If the surface is smooth or not sufficiently roughened, light is reflected substantially along the axis and blocked by the element so it does not reach the detector. If the surface is roughened, however, the reflected light is scattered off-axis and focussed by the lens onto the detector, thereby effectively bypassing the blocking element. Electrical circuitry is connected to receive the output of the detector and activate an indicator to which an operator may refer.
REFERENCES:
patent: 3857637 (1974-12-01), Obenreder
patent: 4072426 (1978-02-01), Horn
patent: 4296333 (1981-10-01), Milana et al.
patent: 4613235 (1986-09-01), Suga
patent: 4945253 (1990-07-01), Frohardt
patent: 5179425 (1993-01-01), Reinsch et al.
patent: 5249029 (1993-09-01), Sommer et al.
patent: 5298974 (1994-03-01), Chandley
Pham Hoa Q.
Veridian ERIM International, Inc.
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