Signal processing circuit for electro-optic probe

Details Signal processing circuit for electro-optic probe Signal processing circuit for electro-optic probe

1998-11-09

2000-07-11

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

2502081, 324761, G01R 31308

Patent

active

06087838&

ABSTRACT:
A signal processing circuit is provided for an electro-optic probe, which is used to perform testing of a printed-circuit board of high-speed processing. When laser beams are incident on the electro-optic probe which is brought into contact with the printed-circuit board, they are changed in polarization and are then converted to electric signals. The electric signals are amplified and are then subjected to analog-to-digital conversion to produce digital data. The laser beams (or optical pulses) are generated based on sampling pulses used for sampling of the analog-to-digital conversion. Herein, the sampling pulses are created based on a sweep signal and a step-like signal. The sweep signal increases in level with a certain slope and then decreases suddenly in one period of a trigger pulse signal. The step-like signal increases in level in a step-like manner, wherein it is increased by a predetermined level in response to each of the sampling pulses. A comparator produces a pulse signal consisting of pulses, each of which appears when the sweep signal coincides with the step-like signal in levels. Then, a mask circuit allows output of only the necessary pulses of the comparator as the sampling pulses. An image display circuit stores a plurality of digital data therein, which are then rearranged in an order so that an image representing a measurement result is displayed.

REFERENCES:
patent: 5057771 (1991-10-01), Pepper
patent: 5500607 (1996-03-01), Verkuil
patent: 5666062 (1997-09-01), Takahashi et al.
M. Shinagawa, et al., "A High-Impedance Probe Based on Electro-Optic Sampling", Proceedings of 15th Meeting on Lightwave Sensing Technology, LST 15-17, May, 1995.

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