Method for producing a transistor using anodic oxidation

Fishing – trapping – and vermin destroying

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437983, 205124, H01L 21786

Patent

active

057473552

ABSTRACT:
A method for producing a thin-film transistor (TFT) in which the gate electrode is offset from the source and drain without detriment to the characteristics of the device or to manufacturing yield, and a structure for such a TFT, are disclosed. A gate electrode is formed using a material capable of anodic oxidation, and a mask is formed on the gate electrode. Using a comparatively low voltage, a comparatively thick, porous anodic oxide film is formed on the sides of the gate electrode. The mask is then removed and using a comparatively high voltage a dense anodic oxide film is formed at least on the top of the gate electrode. Using the gate electrode having this anodic oxide on its top and sides as a mask, an impurity is introduced into the semiconductor film and an offset structure is obtained.

REFERENCES:
patent: 3806778 (1974-04-01), Shimakura
patent: 5289030 (1994-02-01), Yamazaki et al.
patent: 5561075 (1996-10-01), Nakazawa
patent: 5568288 (1996-10-01), Yamazaki

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