Device and method for position measuring

Details Device and method for position measuring Device and method for position measuring

1997-10-02

2000-02-22

Hoff, Marc S.

Data processing: measuring, calibrating, or testing

Calibration or correction system

Position measurement

702150, 702151, 33706, 33707, G01B 1100

Patent

active

060291184

ABSTRACT:
An absolute position-measuring device has several graduation tracks with different graduation periods. Because of the low-pass filter behavior of the scanning elements, scanning signals with a high frequency are effected in the phase. A correction device is provided to compensate this frequency-dependent phase shift (.phi.). As a function of the instantaneous frequency (f) of the scanning signal, the phase of the latter is corrected by a correction value (.phi.) stored in the correction device.

REFERENCES:
patent: 4490914 (1985-01-01), Spies
patent: 4628201 (1986-12-01), Schmitt
patent: 5216626 (1993-06-01), Kranitzky
patent: 5279044 (1994-01-01), Bremer
patent: 5294793 (1994-03-01), Schwaiger et al.
patent: 5726445 (1998-03-01), Thaler et al.
U. Tietze, et al., "Halbleiter--Schaltungestechnik," 10.sup.th edition, pp. 9-13 and 143-155, 1993 (No English Translation).

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