Method for identifying a semiconductor die using an IC with prog

Details Method for identifying a semiconductor die using an IC with prog Method for identifying a semiconductor die using an IC with prog

1992-12-31

1994-04-05

LaRoche, Eugene R.

Static information storage and retrieval

Read only systems

Fusible

3652257, G11C 700

Patent

active

053011430

ABSTRACT:
A method for identifying a semiconductor die includes a programmable integrated circuit formed on the semiconductor die. The programmable circuit includes FET transistors connected to output nodes and to programmable links such as fuses, anti-fuses or laser programmable links which are connected to ground. A gate element of each transistor is connected to an address line which controls current flow through the transistors to the output nodes. During manufacture, the programmable links can be selectively activated to create an identification code which can be read at the output nodes of the integrated circuit upon input of a predetermined address code.

REFERENCES:
patent: 4064493 (1977-12-01), Davis
patent: 4268911 (1981-05-01), Bell
patent: 4419747 (1983-12-01), Jordan
patent: 5008729 (1991-04-01), Wills et al.
patent: 5058059 (1991-10-01), Matsuo
patent: 5120679 (1992-06-01), Boardman et al.
patent: 5134457 (1992-07-01), Hamdy et al.
patent: 5140554 (1992-08-01), Schreck
patent: 5171715 (1992-12-01), Husher et al.

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