X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent
1983-08-10
1985-08-06
Smith, Alfred E.
X-ray or gamma ray systems or devices
Specific application
Fluorescence
378 89, 378206, G01N 2320, G21K 100
Patent
active
045340498
ABSTRACT:
A fluorescent X-ray film thickness gauge comprises an X-ray tube for irradiating X-rays along an X-ray axis to a sample having a film coating whose thickness is to be measured, a detector for detecting fluorescent X-rays emitted from the sample, viewing means including a mirror for enabling an observer to view along the X-ray axis a target spot on the sample at which the X-ray beam is to be directed, and a collimator for collimating the X-rays into an X-ray beam and directing the X-ray beam along the X-ray axis to the target spot on the sample. In a preferred embodiment, the collimator and mirror are both mounted on a displaceable shutter member which is displaceable between a viewing position, in which the mirror is positioned along the X-ray axis to enable viewing of the target spot on the sample while the shutter member blocks the X-rays from irradiating the sample, and an irradiating position, in which the collimator is positioned along the X-ray axis to direct the X-ray beam to the target spot on the sample.
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Instruments and Control Systems 41, (Jan. 1, 1968), p. 59, General Electric Co., advertisement.
Proceedings of the Third International Symposium on Research Materials for Nuclear Measurements, vol. 102, (1972), No. 3, pp. 599-610.
Journal of Physics E: Scientific Instruments, vol. 6, 1973, No. 8, Aug., pp. 781-784.
Adams Bruce L.
Burns Robert E.
Grigsby T. N.
Kabushiki Kaisha Daini Seikosha
Lobato Emmanuel J.
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