Fishing – trapping – and vermin destroying
Patent
1992-09-24
1994-04-05
Quach, T. N.
Fishing, trapping, and vermin destroying
437 20, 437 39, 437 41, 437175, 437203, 437229, 437912, H01L 21338
Patent
active
053004450
ABSTRACT:
A particle beam irradiates a thermohardening resin and selectively hardens the thermohardening resin of the implanted region. The non-hardened resin not irradiated is removed with high selectivity and an inverted pattern of the hardened resin remains as a mask. In one embodiment, a gate electrode is produced in an aperture pattern produced by transfer of the inverted pattern and source and drain electrodes are provided at other aperture patterns to form an HEMT having a narrow gate self-aligned with the source and drain electrodes.
REFERENCES:
patent: 4731339 (1988-03-01), Ryan et al.
patent: 4839310 (1989-06-01), Hollis et al.
patent: 5006478 (1991-04-01), Kobayashi et al.
patent: 5037767 (1991-08-01), Daniel
patent: 5053348 (1991-10-01), Mishra et al.
patent: 5105242 (1992-04-01), Fujihira et al.
Kubena et al, "Dot Lithography For Zero-Dimension Quantum Wells Using Focused Ion Beams", Journal of Vacuum Science and Technology, vol. B6, No. 1, 1988, pp. 353-355.
Briska et al, "Method Of Etching Fine Structures In Silicon", IBM Technical Disclosure Bulletin, vol. 22, No. 3, 1989, p. 1046.
Bartle et al, "Selective Area Ion Implantation For Gallium Arsenide Microwave Devices And Circuits", G.E.C. Journal of Research, vol. 1, No. 3, 1983, pp. 174-177.
Abdel-Motaleb et al, "A Simple Self-Aligned GaAs MESFET Using Polyimide", Solid-State Electronics, vol. 30, No. 4, 1987, pp. 361-363.
Sasaki et al, "A High Electron Mobility Transistor With A Mushroom Gate Fabricated By Focused Ion Beam Lithography", IEEE MTT-S Digest, 1988, pp. 251-253.
Hanyu et al, "Super Low-Noise . . . Gate", Electronics Letters, vol. 24, No. 21, 1988, pp. 1327-1328.
"Nikkei Electronics", 1989, pp. 91-95.
Yamasaki et al, "GaAs LSI-Directed . . . (SAINT)", IEEE . . . Electron Devices, vol. ED-29, No. 11, 1982, pp. 1772-1777.
Imai et al, "Novel Process . . . Spin on Glass (SOG)", Japanese Journal of Applied Physics, vol. 29, No. 11, 1990, pp. 2653-2656.
Wolf, S. et al., Silicon Processing for the VLSI Era, vol. 1, 1986, Lattice Press, pp. 308-327.
Mitsubishi Denki & Kabushiki Kaisha
Quach T. N.
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