Two-dimensional semiconductor image sensor with regulated integr

Details Two-dimensional semiconductor image sensor with regulated integr Two-dimensional semiconductor image sensor with regulated integr

1982-08-19

1985-01-29

Rubinson, Gene Z.

Facsimile and static presentation processing

Facsimile

Recording apparatus

358213, 358167, H04N 312

Patent

active

044969805

ABSTRACT:
A two-dimensional image sensor integrated on a semiconductor substrate has a plurality of sensor elements disposed in rows and columns. The sensors in each row and column are individually selected in succession via parallel outputs of a vertical shift register for readout of the sensor elements. Regulation of the integration time during which charge carriers collect in the sensor elements due to incident light is achieved by selecting the sensor elements in each even-numbered row for readout a further number of times after an initial readout of the charges optically generated therein, and within the time span during which transfer of the charges from the sensor elements of the next odd-numbered rows to the column lines takes place. The further selections eliminate charges formed in the interim in a particular row. The next readout of the particular row is undertaken with an integration time for the sensor elements therein which is variably shortened by the duration of the readout for (2N-1) rows, where N is the number of even or odd numbered rows.

REFERENCES:
patent: 4189749 (1980-02-01), Hiroshima et al.
patent: 4233632 (1980-11-01), Akiyama
patent: 4242700 (1980-12-01), Weimer
patent: 4380755 (1983-04-01), Endlicher et al.
patent: 4413283 (1983-11-01), Aoki et al.

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