IC tester having a pattern selector capable of selecting pins of

Details IC tester having a pattern selector capable of selecting pins of IC tester having a pattern selector capable of selecting pins of

1991-12-17

1995-07-11

Beausoliel, Jr., Robert W.

Excavating

371 211, 371 221, G11C 2900, H04B 1700

Patent

active

054327970

ABSTRACT:
In an IC tester for testing a memory built in a logic IC, a memory test pattern generator includes a waveform control pattern memory and a logical comparison pattern memory, and waveform control pattern data and logical comparison control pattern data from these pattern memories are supplied to a waveform controller and a logical comparator via a pattern selector capable of selectively switching to respective pins of the IC under test.

REFERENCES:
patent: 4768195 (1988-08-01), Stoner et al.
patent: 4862460 (1989-08-01), Yamaguchi
patent: 4928278 (1990-05-01), Otsuji et al.
patent: 4958346 (1990-09-01), Fujisaki
patent: 5127011 (1992-06-01), Combs et al.

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