Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1991-06-28
1995-07-11
Karlsen, Ernest F.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
345 87, 345904, 348129, G01R 31302, G01R 3102
Patent
active
054324610
ABSTRACT:
A testing method for active matrix liquid crystal display substrates having thin film transistors provided with a plurality of pixel electrodes, a plurality of source lines, and a plurality of gate lines formed on a substrate. A high resolution electro-optical element whose optical properties change when an electrical field is impressed on it is disposed above the active matrix liquid crystal display substrate and separated therefrom by an extremely small gap. Electric current is caused to flow between the pixel electrodes on the active matrix liquid crystal display substrate and the transparent thin film electrodes on the surface of the electro-optical element, creating an electrical field in the electro-optical element. By detecting local changes in the optical properties of the electro-optical element, defects in the pixels of the active matrix liquid crystal display substrate can be detected.
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Karlsen Ernest F.
Photon Dynamics, Inc.
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