Radiant energy – Infrared-to-visible imaging
Patent
1990-04-18
1992-12-01
Hannaher, Constantine
Radiant energy
Infrared-to-visible imaging
374 44, G01N 2518
Patent
active
051681617
ABSTRACT:
There is disclosed a system and method for generating characteristics of a surface using an analysis of the infrared image of the surface. A heat balance equation is generated and a technique is presented for solving the equation to generate the absorptivity and conductivity indices of the surface. These indices are matched against a data base of indices of various surfaces to achieve material identification. An embodiment is disclosed in which the indices are used to predict surface appearance in the infrared image for different points in time.
REFERENCES:
patent: 3868508 (1975-02-01), Lloyd
patent: 4853538 (1989-08-01), Jackson
"Prediction of Temporal Changes of Natural Terrain Infrared Images", N. Ben-Yosef, K. Wilner, S. Lashansky, & M. Abitbol; SPIE, vol. 807 Passive Infrared Systems & Technology, 1987, pp. 58-60.
Ben-Yosef et al. "Natural terrain infrared radiance statistics: daily variation." Applied Optics, 24(23):4167-4171, 1985.
S. Geman and D. Geman, "Stochastic Relaxation, Gibbs Distribution, and the Bayesian Restoration of Images," IEEE Transactions on Pattern Analysis and Machine Intelligence, 6(6):721-741, Nov. 1984.
F. P. Incropera and D. P. DeWitt, Introduction to Heat Transfer. John Wiley & Sons, 1985 pp. 244-279.
C. Koch and et al. "Computing optical flow in resistive networks and in the primate visual system," In Proceedings: Workshop on Visual Motion, pp. 62-72, Mar. 1989.
J. Marroquin, S. Mitter, and T. Poggio, "Probabilistic Solution of Ill-Posed Problems in Computational Vision." Technical Report AI Memo 897, MIT, AI Lab, Mar. 1987.
N. Nandhakumar and J. K. Aggarwal, "Integrated analysis of thermal and visual images for scene interpretation." IEEE Transactions on Pattern Analysis and Machine Intelligence, 10(4):469-481, 1988.
Donaldson Richard L.
Griebenow L. Joy
Hannaher Constantine
Hiller William E.
Texas Instruments Incorporated
LandOfFree
System and method of determining surface characteristics using i does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method of determining surface characteristics using i, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method of determining surface characteristics using i will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-504222