Optical bench for a semiconductor laser and method

Optics: measuring and testing – Angle measuring or angular axial alignment – Alignment of axes nominally coaxial

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356400, G01B 1125

Patent

active

049972790

ABSTRACT:
An alignment fixture includes an optical bench 12 mounting a semiconductor laser 21, a monitor 23 of optical emission, a lens 27 focused for transmitting optical emission along an optical axis 43, a holder 26 mounting the lens 27, a pedestal 36 positioning a diaphragm 29 spaced for the lens 27, an optical fiber 45, a tube 49 surrounding the fiber 45 and joined to the fiber 45, a bushing 55 surrounding the tube 49 and joined to the optical bench 12, and a datum surface 16' on the bench 12 for aligning the lens 27 and the fiber 45 with the optical axis 43.

REFERENCES:
patent: 4003075 (1977-01-01), Yonezu et al.
patent: 4650276 (1987-03-01), Lanzisera et al.
patent: 4722587 (1988-02-01), Thorsten
patent: 4772123 (1988-09-01), Radner

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