Programmable tester method and apparatus

Details Programmable tester method and apparatus Programmable tester method and apparatus

1976-08-18

1978-01-24

Smith, Jerry

Registers

Systems controlled by data bearing records

Time analysis

364490, 364580, 324 73R, G06F 1104, G01R 3128

Patent

active

040705650

ABSTRACT:
A method and apparatus for automatic, programmed, in-circuit testing of individual logic elements. A plurality of program-operated device connection switches are provided for making connections to the circuit under test. A plurality of program-operated drive circuits are provided for driving nodes of the logic element under test with controlled current, voltage and power to logical 1, logical 0, or a high impedence state. A measurement unit measures an output from the logic element under test. Testing programs are run in a program-controlled processor. The programs have subroutines which correlate with individual types of logic elements. Each logic element is examined, in circuit, independently of neighboring logic elements. A translation memory stores data for translating node addresses to facilitate topology independent subroutine processing of identical elements.

REFERENCES:
patent: 3631229 (1971-12-01), Bens et al.
patent: 3764995 (1973-10-01), Helf, Jr.
patent: 3931506 (1976-01-01), Borrelli et al.
patent: 4000460 (1976-12-01), Kadakia et al.

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