Process for plasma etching

Chemistry: electrical and wave energy – Processes and products – Vacuum arc discharge coating

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

204298, 156643, C23F 102, H05H 124

Patent

active

043303846

ABSTRACT:
Micro-wave plasma etching is carried out with a gas containing at least SF.sub.6 as an etching gas at a high etching rate of silicon, and a high selectivity, with an easy monitoring and a low temperature dependency.

REFERENCES:
patent: 4101411 (1978-07-01), Suzuki et al.
patent: 4138306 (1979-02-01), Niwa
patent: 4175235 (1979-11-01), Niwa et al.
S. Ichimaru, Basic Principles of Plasma Physics, W. A. Benjamin, Inc., Reading, Massachusetts, 1973, Section 7.5A.
Rikagakujiten (Dictionary of Physics and Chemistry), 3rd Ed., 1971 p. 1323.
Y. Horbike and M. Shibagaki, Dry Etching Technology . . . ; Electrochem. Society-Semiconductor Silicon, p. 1071ff, 5/1977.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for plasma etching does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for plasma etching, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for plasma etching will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-485648

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.