Line inspection system

Image analysis – Histogram processing – For setting a threshold

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356237, 382 65, G06K 900

Patent

active

046619844

ABSTRACT:
A line inspection system suitable for inspecting printed circuit boards for defects. In a first embodiment disclosed, a plurality of sensors which detect the presence or absence of conductor material on the board are grouped in a preestablished pattern. The area of the circuit board to be inspected is scanned by the sensing pattern and logical sequences of sensor condition which indicate defects are searched for. In a second embodiment disclosed, the area to be inspected is scanned serially, and the resultant data stored. Logical analysis is then performed on the stored data to determine whether the pattern of data is or is not consistent with an acceptable part.

REFERENCES:
patent: 2958464 (1960-11-01), Nassenstein
patent: 3541510 (1970-11-01), Nishioka
patent: 3563666 (1971-02-01), Foster
patent: 3611290 (1971-10-01), Luisi et al.
patent: 3620629 (1971-11-01), Whittington
patent: 3647961 (1972-03-01), Blitchington et al.
patent: 3671941 (1972-06-01), Takahashi et al.
patent: 3873974 (1975-03-01), Bouton et al.
patent: 4021778 (1977-05-01), Ueda et al.
patent: 4083035 (1978-04-01), Riganati et al.
patent: 4109237 (1978-08-01), Hill
patent: 4170003 (1979-10-01), Danielsson et al.
patent: 4223387 (1980-09-01), Danielsson et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Line inspection system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Line inspection system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Line inspection system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-481314

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.