Method and apparatus for monitoring film thickness between rotat

Details Method and apparatus for monitoring film thickness between rotat Method and apparatus for monitoring film thickness between rotat

1983-12-12

1987-04-28

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324226, 324227, 324239, G01B 710, G01R 3312

Patent

active

046617744

ABSTRACT:
An improved method and apparatus for monitoring the thickness of a film includes a sensor roll which cooperates with a compliant roll to form a nip through which the film passes. As the two rolls rotate relative to each other, magnets disposed in the sensor roll are sequentially moved to and from the nip. As a magnet moves by the nip, the field emanating from the magnet is concentrated by a body of material having a relatively high magnetic permeability and disposed in the compliant roll. This results in an induced voltage being generated in a sensor coil. The output from the sensor coil is transmitted to control circuitry which effects operation of a suitable apparatus to control the thickness of the film.

REFERENCES:
patent: 2703384 (1965-03-01), Rendel
patent: 3662576 (1972-05-01), Girlatschek
patent: 3683273 (1972-08-01), Behr et al.
patent: 3857095 (1974-12-01), Mitchie et al.
patent: 3866115 (1975-02-01), Lewis
patent: 3902114 (1975-08-01), Alich
patent: 3922599 (1975-11-01), Steingroever et al.
patent: 4345203 (1982-08-01), Vermeiren et al.
French article "Measurement without a Contact", CETIM-Informations,-No. 76, pp. 94-98.

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