Sample cell monitoring system

Optics: measuring and testing – For size of particles – By particle light scattering

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356343, G01N 1502

Patent

active

049078844

ABSTRACT:
The light intensity incident on a scattering sample contained in a scattering cell is monitored by simultaneous measurements of the light incident on the cell before entering it and the light transmitted through the cell after leaving it. Means to monitor the product of these signals is disclosed and how this product is related to the actual incident intensity at the sample is explained. The invention is presented in the context of the scattering cell of the parent application.

REFERENCES:
patent: 3713743 (1973-01-01), Simms
patent: 4134679 (1979-01-01), Wertheimer
patent: 4167335 (1979-09-01), Williams
patent: 4515473 (1985-05-01), Mermelstein
patent: 4541719 (1985-09-01), Wyatt
Arkin et al., Statistical Methods, Barnes & Noble, Inc., New York, fifth edition, copyright 1970, pp. 29-30.

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