Optical wavelength analyzer and image processing system utilizin

Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

357 5, H01J 4014

Patent

active

048145980

ABSTRACT:
An apparatus for measuring the intensity of incident optical radiation utilizes the properties of superconductivity films. The apparatus may include at least one Josephson junction having the optical radiation incident thereupon, an electronic circuit coupled to receive a signal from the Josephson junction proportional to the incident radiation. The Josephson junction has a time-current switching threshold current selected to switch the function 50% of the time. A feedback loop from the electronic circuit maintains the function operation. One or more junctions may be used to monitor radiation of different wavelengths or to produce optical images.

REFERENCES:
patent: 4117503 (1978-09-01), Zappe
patent: 4245169 (1981-01-01), Hamilton
patent: 4334158 (1982-06-01), Faris
patent: 4401900 (1983-08-01), Faris
patent: 4521682 (1985-06-01), Murakami et al.
patent: 4533840 (1985-08-01), Gheewala et al.
patent: 4638185 (1987-01-01), Kobayashi et al.
"Analog Measurement Applications for High Speed Josephson Switches" Hamilton et al., IEEE Transactions on Magnetics, vol. MAG-17, No. 1, Jan. 1981.
"Picosecond Sampling with Josephson Junctions" Peter Wolf, Picosecond Electronics and Optoelectronics, edited by Mourou et al., Springer Vertag IBM Journal of Research and Development, vol. 24, No. 2/Mar. 1980.
Sampling Techniques Primer TEK 7000 Series Modular Oscilloscopes, Technique Primer 42W-5969 .COPYRGT.1985.
"Observation of Grain Boundary Josephson Current in BaPb.sub.0.7 Bi.sub.0.3 O.sub.3 Films" Enomoto et al., Japanese Journal of Applied Physics, vol. 20, No. 9, Sep. 1981, pp. L661-L664.
"Transient Responses of Superconducting Lead Films Measured with Picosecond Laser Pulses", C. C. Chi et al., Physical Review B, vol. 23, No. 1, Jan. 1, 1981.
"Highly Sensitive Optical Detector Using Superconducting Oxide BaPb.sub.0.7 Bi.sub.0.3 ", Enomoto et al., Japanese Journal of Applied Physics, vol. 2M, No. 5, May 1, 1984, pp. L333-L335.
TEK Products 1987, Tektronix.
"Effect and Applications of Pattern Laser Illumination on Superconducting Films", C. C. Chi et al., Physical Review B, vol. 29, No. 9, May 1, 1984, pp. 4908-4913.
"Transient Response of Superconducting Pb Microbridges Irradiated by Picosecond Laser Pulses and its Potential Applications" C. C. Chi et al., IEEE Transactions on Magnetics, vol. MAG-17, No. 1, Jan. 1981.
"Non-Equilibrium Phenomena in Superconductivity", D. N. Langenberg, Proceedings of the 14th International Conference on Law Temp. Physics, vol. 5, 1975.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Optical wavelength analyzer and image processing system utilizin does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical wavelength analyzer and image processing system utilizin, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical wavelength analyzer and image processing system utilizin will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-478863

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.