Electron-beam exposure system having an improved rate of exposur

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250398, H01J 37302

Patent

active

054480752

ABSTRACT:
An electron beam exposure system includes a pattern memory for storing bitmap data of a pattern to be exposed, wherein the pattern memory includes a number of latch elements arranged in rows and columns such that the writing of the bitmap data is achieved line by line and such that the reading of the bitmap data is achieved column by column.

REFERENCES:
patent: 5369282 (1994-11-01), Arai et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Electron-beam exposure system having an improved rate of exposur does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electron-beam exposure system having an improved rate of exposur, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electron-beam exposure system having an improved rate of exposur will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-473829

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.