Measuring and testing – Probe or probe mounting
Patent
1998-02-11
1999-08-24
Williams, Hezron
Measuring and testing
Probe or probe mounting
324 725, 324754, 439482, G01D 2100
Patent
active
059427019
ABSTRACT:
There are provided a test probe for a measuring instrument, and a tester incorporating the test probe. The test probe includes a probe, a lead wire, a grip and a lead wire-holding piece. A probe for being brought into contact with a measuring object has a proximal end. A lead wire has one end thereof connected to a main unit of the measuring instrument and the other end thereof connected to the probe. A grip protects a portion connecting the probe and the lead wire. The grip is engaged with the proximal end of the probe. A lead wire-holding piece fixedly holds a distal end of the covered portion of the lead. The grip has a retaining portion engaged with the lead wire-holding piece for preventing the lead wire from being drawn out from the grip. In another form, the test probe has a crimp contact for connecting the proximal end of the probe and an uncovered portion of the lead wire. The grip protects a portion connecting the probe and the lead wire, including the crimp contact. The grip is fixedly engaged with the proximal end of the probe.
REFERENCES:
patent: 5041781 (1991-08-01), Kawada et al.
patent: 5084673 (1992-01-01), Kamaza
patent: 5235268 (1993-08-01), Harthcock
patent: 5414346 (1995-05-01), Mohan
patent: 5448162 (1995-09-01), Beha
Seiko Epson Corporation
Tran Thuy Vinh
Williams Hezron
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