Manufacturing test data storage apparatus for dynamically reconf

Details Manufacturing test data storage apparatus for dynamically reconf Manufacturing test data storage apparatus for dynamically reconf

1985-12-12

1988-11-08

Atkinson, Charles E.

Excavating

364200, 371 9, G06F 1120

Patent

active

047837829

ABSTRACT:
A cellular array processor chip potentially having an unknown number of defects randomly located thereon includes a machine readable record of each defect location, integrated thereon. The record can be a PROM that is programmed at, or after, the end of manufacturing testing.

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Kurth et al., Universal Physical Memory Bit Fail Map, IBM Technical Discl. Bulletin, vol. 26, No. 11, Apr. 1984, pp. 5996-6000.

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