Breakdown protected planar transistor device

Electricity: electrical systems and devices – Safety and protection of systems and devices – With specific voltage responsive fault sensor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

361 93, 361101, 330207P, H02H 320

Patent

active

047164891

ABSTRACT:
A protection circuit is provided for a planar transistor device. The protection circuit comprises a variable resistor device formed of a junction type field effect transistor. The resistor device is connected in series with the base of the planar transistor. The drain electrode of the J-FET is connected to the base of the planar transistor while the collector of the planar transistor is connected to the gate of the J-FET. Due to this interconnected scheme, base input resistance of the planar transistor is increased to reduce its base current when a high voltage is applied accidentally to the collector. The base current is not eliminated, however, and the device is protected but can still operate.

REFERENCES:
patent: 3336503 (1967-08-01), White
patent: 3601625 (1971-08-01), Radwine et al.
patent: 3970869 (1976-07-01), Coats, Jr.
patent: 3989962 (1976-11-01), Takagi et al.
patent: 3992650 (1976-11-01), Iwasa et al.
patent: 4355341 (1982-10-01), Kaplan
patent: 4400711 (1983-08-01), Avery
patent: 4495536 (1985-01-01), Bynum

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Breakdown protected planar transistor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Breakdown protected planar transistor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Breakdown protected planar transistor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-466172

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.