Capacitor power probe

Details Capacitor power probe Capacitor power probe

1988-12-19

1991-12-24

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, G01R 3102

Patent

active

050756214

ABSTRACT:
A probe for testing integrated circuit wafers is disclosed herein. The probe comprises a ceramic body having an extended voltage contact on the upper most surface, an extended ground contact on the lower most surface, sets of interdigitated internal metallic plates, one set of plates beginning at the voltage contact and extending part way into the body and the other set of plates beginning at the ground contact and extending interdigitally into the body between the other set of plates, but separated therefrom by the material of the body and a needle-like member contacts which connected to one of the needle-like members has a cantilevered tip adapted to contact a semiconductor circuit interconnection pad.

REFERENCES:
patent: 3702439 (1972-11-01), McGahey et al.
patent: 3849728 (1974-11-01), Evans
patent: 4161692 (1979-07-01), Tarzwell
patent: 4199737 (1980-04-01), Patterson et al.
patent: 4617609 (1986-10-01), Utner et al.
patent: 4623839 (1986-11-01), Garretson et al.
patent: 4638402 (1987-01-01), Lim et al.
patent: 4791363 (1988-12-01), Logan
IBM TDB, vol. 18, No. 11, Apr. 1976, pp. 3629-3630, "Bypass Capacitor for Chip Probe", A. Bry et al.
IBM TDB, vol. 18, No. 3, Aug. 1975, pp. 749-750, "High-Performance AC Chip Contactor", R. M. Morton et al.

Affiliated with

Also associated with

Rating

Capacitor power probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Capacitor power probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Capacitor power probe will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-45726