Test control circuit for integrated circuit

Details Test control circuit for integrated circuit Test control circuit for integrated circuit

1987-07-08

1989-06-06

Smith, Jerry

Excavating

371 15, G06F 1100

Patent

active

048377651

ABSTRACT:
For shortening the time period needed for test of component function blocks fabricated on a semiconductor chip and detecting a circuit trouble, there is disclosed a test control circuit for an integrated circuit having a plurality of component blocks including at least two component blocks responsive to respective data signals or a common test signal and achieving predetermined functions, respectively, to produce respective output signals based on the respective data signals or the common test signal, the predetermined functions being identical with one another, comprising (a) a control signal generating circuit responsive to a command signal and capable of producing at least two prohibiting signals applied to the at least two component blocks, respectively (b) a mode selecting circuit responsive to a test mode signal and causing the at least two component blocks to respond to the common test signal, and (c) a logic circuit carrying out a logical operation for the output signals supplied from the at least two component blocks and producing an output signal, wherein each of the at least two component blocks suspends the production of the output signal based on the common test signal in the presence of said prohibiting signal, so that the at least two component blocks are examined in the absence of the prohibiting signal and the logic circuit is examined in the presence of the prohibiting signal.

REFERENCES:
patent: 4241307 (1980-12-01), Hong
patent: 4503537 (1985-03-01), McAnney
patent: 4597042 (1986-06-01), d'Angeac

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