Integrated circuit control

Details Integrated circuit control Integrated circuit control

1996-06-20

1997-03-11

Beausoliel, Jr., Robert W.

Excavating

371 225, 371 251, 371 221, 371 24, 326 93, 326 16, G01R 3128

Patent

active

056109270

ABSTRACT:
An integrated circuit is described having a scan chain of the JTAG type in which there are provided a plurality of serially connected test cells 2. The test cells serve the additional function of operating during the normal operation of the integrated circuit to store signal values that are logically combined (compared) with signal values generated by the integrated circuit to yield control signals into for controlling the operation of the integrated circuit. This allows the storage capacity of the test cells to be utilised during normal operation when they would otherwise be idle.

REFERENCES:
patent: 4945536 (1990-07-01), Hancu
patent: 5001713 (1991-03-01), Whetsel
patent: 5130988 (1992-07-01), Wilcox et al.
patent: 5175447 (1992-12-01), Kawasaki et al.

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